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Pre-bonding characterization of SiCN enabled wafer stacking
Publication:
Pre-bonding characterization of SiCN enabled wafer stacking
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Peng, Lan
;
Kim, Soon-Wook
;
Iacovo, Serena
;
Inoue, Fumihiro
;
De Vos, Joeri
;
Sleeckx, Erik
;
Miller, Andy
;
Beyer, Gerald
;
Beyne, Eric
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Views
1888
since deposited on 2021-10-27
3
last month
Acq. date: 2026-02-26
Citations