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A 10.1 ENOB, 6.2fJ/con.-step, 500MS/s ringamp-based pipelined-SAR ADC with background calibration and dynamic reference regulation in 16nm CMOS

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dc.contributor.authorLagos Benites, Jorge
dc.contributor.authorMarkulic, Nereo
dc.contributor.authorHershberg, Benjamin
dc.contributor.authorDermit, Davide
dc.contributor.authorShrivas, Mithlesh
dc.contributor.authorMartens, Ewout
dc.contributor.authorCraninckx, Jan
dc.contributor.imecauthorLagos Benites, Jorge
dc.contributor.imecauthorMarkulic, Nereo
dc.contributor.imecauthorHershberg, Benjamin
dc.contributor.imecauthorDermit, Davide
dc.contributor.imecauthorShrivas, Mithlesh
dc.contributor.imecauthorMartens, Ewout
dc.contributor.imecauthorCraninckx, Jan
dc.contributor.orcidimecMarkulic, Nereo::0000-0001-6691-4647
dc.contributor.orcidimecShrivas, Mithlesh::0000-0001-6063-2059
dc.contributor.orcidimecCraninckx, Jan::0000-0002-3980-0203
dc.date.accessioned2021-10-31T09:21:17Z
dc.date.available2021-10-31T09:21:17Z
dc.date.issued2021
dc.identifier.doi
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36878
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9492354
dc.source.conference2021 Symposium on VLSI Circuits
dc.source.conferencedate13/06/2021
dc.source.conferencelocationKyoto Japan
dc.title

A 10.1 ENOB, 6.2fJ/con.-step, 500MS/s ringamp-based pipelined-SAR ADC with background calibration and dynamic reference regulation in 16nm CMOS

dc.typeProceedings paper
dspace.entity.typePublication
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