Publication:
NBTI reliability of Ni FUSI/HfSiON gates: effect of silicide phase
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1898 since deposited on 2021-10-16
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Acq. date: 2026-07-17
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Statistics
Views
1898 since deposited on 2021-10-16
1last month
1last week
Acq. date: 2026-07-17
Citations