Publication:

Reliability investigation of a source side injection local charge trapping device

Date

2004
Presentation
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dc.contributor.authorBreuil, Laurent
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorBlomme, Pieter
dc.contributor.authorLorenzini, Martino
dc.contributor.authorWellekens, Dirk
dc.contributor.authorDe Vos, Joeri
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.imecauthorBlomme, Pieter
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorDe Vos, Joeri
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecDe Vos, Joeri::0000-0002-9332-9336
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-15T12:47:43Z
dc.date.available2021-10-15T12:47:43Z
dc.date.issued2004
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8636
dc.source.conference20th IEEE Non-Volatile Semiconductor Memory Workshop - NVSMW
dc.source.conferencedate22/08/2004
dc.source.conferencelocationMonterey California, USA
dc.title

Reliability investigation of a source side injection local charge trapping device

dc.typeOral presentation
dspace.entity.typePublication
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