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European Test Symposium Teams: an Anniversary Snapshot

 
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cris.virtual.orcid0000-0002-5058-8303
cris.virtual.orcid0000-0001-7325-8836
cris.virtualsource.department8a303854-e9b4-460a-b79d-03df3b3c4394
cris.virtualsource.department52be9e5e-be21-4e16-bad5-1335c497e6fd
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cris.virtualsource.orcid52be9e5e-be21-4e16-bad5-1335c497e6fd
dc.contributor.authorJenihhin, M.
dc.contributor.authorRaik, J.
dc.contributor.authorJutman, A.
dc.contributor.authorCherezova, N.
dc.contributor.authorUbar, R.
dc.contributor.authorMiclea, L.
dc.contributor.authorEnyedi, S.
dc.contributor.authorStefan, I.
dc.contributor.authorStan, O.
dc.contributor.authorCorches, C.
dc.contributor.authorPeng, Z.
dc.contributor.authorEles, P.
dc.contributor.authorDrechsler, R.
dc.contributor.authorEggersgluss, S.
dc.contributor.authorFey, G.
dc.contributor.authorGlowatz, A.
dc.contributor.authorTille, D.
dc.contributor.authorGielen, G.
dc.contributor.authorCoyette, A.
dc.contributor.authorDobbelaere, W.
dc.date.accessioned2026-03-19T09:37:51Z
dc.date.available2026-03-19T09:37:51Z
dc.date.createdwos2025-10-10
dc.date.issued2025
dc.description.abstractThe IEEE European Test Symposium (ETS) has been facilitating progress in electronic systems testing since its launch in 1996. On the occasion of its 30th anniversary, this collaborative paper gathers sections by 21 ETS teams to outline their influential ideas and milestones. Each team’s section highlights historical perspective, current research, frameworks and projects as well as forward-looking research agendas in the area of electronic-based circuits and systems testing, reliability, safety, security and validation. This anniversary summary documents how research of various ETS teams, exemplifying the test community, has been evolving and transitioning from concepts to practical standards and Electronic Design Automation (EDA) tools and flows. This legacy is a strong base to drive the next generation of advances in electronic systems testing.
dc.identifier.doi10.1109/ETS63895.2025.11049652
dc.identifier.isbn979-8-3315-9451-0
dc.identifier.issn1530-1877
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/58868
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherIEEE
dc.source.beginpageN/A
dc.source.conferenceIEEE European Test Symposium (ETS)
dc.source.conferencedate2025-05-26
dc.source.conferencelocationTallinn
dc.source.journal2025 IEEE EUROPEAN TEST SYMPOSIUM, ETS
dc.source.numberofpages48
dc.subject.keywordsANALOG
dc.title

European Test Symposium Teams: an Anniversary Snapshot

dc.typeProceedings paper
dspace.entity.typePublication
imec.identified.statusLibrary
imec.internal.crawledAt2025-10-22
imec.internal.sourcecrawler
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