Publication:
Diagnostics of the quality of MOSFETs
Date
| dc.contributor.author | Vandamme, Ewout | |
| dc.contributor.author | Vandamme, Lorenz | |
| dc.date.accessioned | 2021-09-29T15:42:43Z | |
| dc.date.available | 2021-09-29T15:42:43Z | |
| dc.date.issued | 1996 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1599 | |
| dc.source.beginpage | 1107 | |
| dc.source.endpage | 1112 | |
| dc.source.journal | Microelectronics and Reliability | |
| dc.source.volume | 36 | |
| dc.title | Diagnostics of the quality of MOSFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |