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Analysis of dark current in Ge-on-Si photodiodes at cryogenic temperatures

Date

2020
Proceedings Paper
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dc.contributor.authorPizzone, Andrea
dc.contributor.authorSrinivasan, Ashwyn
dc.contributor.authorVerheyen, Peter
dc.contributor.authorLepage, Guy
dc.contributor.authorBalakrishnan, Sadhishkumar
dc.contributor.authorVan Campenhout, Joris
dc.contributor.imecauthorPizzone, Andrea
dc.contributor.imecauthorSrinivasan, Srinivasan Ashwyn
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorLepage, Guy
dc.contributor.imecauthorBalakrishnan, Sadhishkumar
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorSrinivasan, Ashwyn
dc.contributor.orcidimecVerheyen, Peter::0000-0002-8245-9442
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.date.accessioned2022-01-06T11:01:21Z
dc.date.available2021-11-02T16:05:48Z
dc.date.available2022-01-06T11:01:21Z
dc.date.issued2020
dc.identifier.eisbn978-1-7281-5891-4
dc.identifier.issn2374-0140
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38233
dc.publisherIEEE
dc.source.conferenceIEEE Photonics Conference (IPC)
dc.source.conferencedateSEP 28-OCT 01, 2020
dc.source.conferencelocationVirtual
dc.source.journalna
dc.source.numberofpages2
dc.title

Analysis of dark current in Ge-on-Si photodiodes at cryogenic temperatures

dc.typeProceedings paper
dspace.entity.typePublication
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