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Characterization of HF-last cleaning of ion-implanted Si surfaces
Publication:
Characterization of HF-last cleaning of ion-implanted Si surfaces
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Date
1999
Proceedings Paper
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3535.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kondoh, Eiichi
;
Baklanov, Mikhaïl
;
Maex, Karen
Journal
Abstract
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1890
since deposited on 2021-10-06
1
last month
Acq. date: 2025-12-11
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Metrics
Views
1890
since deposited on 2021-10-06
1
last month
Acq. date: 2025-12-11
Citations