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Impact of temperature and breakdown statistics on reliability predictions for ultra-thin oxides
Publication:
Impact of temperature and breakdown statistics on reliability predictions for ultra-thin oxides
Date
1999
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Groeseneken, Guido
;
Degraeve, Robin
;
Kaczer, Ben
Journal
Abstract
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1944
since deposited on 2021-10-06
1
last month
Acq. date: 2025-12-06
Citations
Metrics
Views
1944
since deposited on 2021-10-06
1
last month
Acq. date: 2025-12-06
Citations