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Impact of temperature and breakdown statistics on reliability predictions for ultra-thin oxides
Publication:
Impact of temperature and breakdown statistics on reliability predictions for ultra-thin oxides
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Date
1999
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Groeseneken, Guido
;
Degraeve, Robin
;
Kaczer, Ben
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1948
since deposited on 2021-10-06
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last week
Acq. date: 2026-01-08
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Metrics
Views
1948
since deposited on 2021-10-06
4
last month
3
last week
Acq. date: 2026-01-08
Citations