Publication:
Influence of an accumulation back-gate voltage on the low-frequency noise spectra of 0.13 μm fully-depleted SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers
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1975 since deposited on 2021-10-15
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Acq. date: 2026-10-13
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Statistics
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1975 since deposited on 2021-10-15
1last month
1last week
Acq. date: 2026-10-13
Citations