Publication:
Influence of an accumulation back-gate voltage on the low-frequency noise spectra of 0.13 μm fully-depleted SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1973 since deposited on 2021-10-15
Acq. date: 2026-01-07
Citations
Metrics
Views
1973 since deposited on 2021-10-15
Acq. date: 2026-01-07
Citations