Scanning spreading resistance microscopy for the electrical characterization of diamond interfacial layers

dc.contributor.author	Xu, Blair
dc.contributor.author	Hantschel, Thomas
dc.contributor.author	Tsigkourakos, Menelaos
dc.contributor.author	Vandervorst, Wilfried
dc.contributor.imecauthor	Hantschel, Thomas
dc.contributor.imecauthor	Vandervorst, Wilfried
dc.contributor.orcidimec	Hantschel, Thomas::0000-0001-9476-4084
dc.date.accessioned	2021-10-23T01:16:00Z
dc.date.available	2021-10-23T01:16:00Z
dc.date.issued	2015
dc.identifier.issn	1862-6300
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/26205
dc.identifier.url	http://onlinelibrary.wiley.com/doi/10.1002/pssa.201532234/abstract
dc.source.beginpage	2578
dc.source.endpage	2582
dc.source.issue	11
dc.source.journal	Physica Status Solidi A
dc.source.volume	212
dc.title	Scanning spreading resistance microscopy for the electrical characterization of diamond interfacial layers
dc.type	Journal article
dspace.entity.type	Publication
Files
Publication available in collections:	Articles