Publication:
Impact of nitridation of SiO2 gate oxide on 1/f noise in 0.18μm CMOS
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1 since deposited on 2021-10-14
Acq. date: 2025-10-23
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1894 since deposited on 2021-10-14
Acq. date: 2025-10-23
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1 since deposited on 2021-10-14
Acq. date: 2025-10-23
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1894 since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations