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Calibration and application of a DSA Compact model for grapho-epitaxy hole processes using contour-based metrology
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Calibration and application of a DSA Compact model for grapho-epitaxy hole processes using contour-based metrology
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Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fenger, Germain
;
Burbine, Andrew
;
Torres, J. Andres
;
Ma, Yuansheng
;
Granik, Yuri
;
Krasnova, Polina
;
Vandenberghe, Geert
;
Gronheid, Roel
;
Bekaert, Joost
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1969
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Acq. date: 2025-12-11
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Views
1969
since deposited on 2021-10-22
1
last month
1
last week
Acq. date: 2025-12-11
Citations