Performance degradation of LC-tank VCOs by impact of digital switching noise in lightly doped substrates

dc.contributor.author	Soens, Charlotte
dc.contributor.author	Van der Plas, Geert
dc.contributor.author	Wambacq, Piet
dc.contributor.author	Donnay, Stephane
dc.contributor.author	Kuijk, Maarten
dc.contributor.imecauthor	Soens, Charlotte
dc.contributor.imecauthor	Van der Plas, Geert
dc.contributor.imecauthor	Wambacq, Piet
dc.contributor.imecauthor	Donnay, Stephane
dc.contributor.orcidimec	Van der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimec	Wambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimec	Donnay, Stephane::0000-0003-2489-4793
dc.date.accessioned	2021-10-16T05:19:33Z
dc.date.available	2021-10-16T05:19:33Z
dc.date.issued	2005-07
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/11253
dc.source.beginpage	1472
dc.source.endpage	1481
dc.source.issue	7
dc.source.journal	IEEE Journal of Solid State Circuits
dc.source.volume	40
dc.title	Performance degradation of LC-tank VCOs by impact of digital switching noise in lightly doped substrates
dc.type	Journal article
dspace.entity.type	Publication
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