Publication:

Effects of electron irradiation on SiGe devices

Date

2010
Journal article
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dc.contributor.authorOhyama, Hidenori
dc.contributor.authorNagano, T.
dc.contributor.authorTakakura, K.
dc.contributor.authorMotoki, M.
dc.contributor.authorMatsuo, K.
dc.contributor.authorNakamura, H.
dc.contributor.authorSawada, M.
dc.contributor.authorKuboyama, S.
dc.contributor.authorBargallo Gonzalez, Mireia
dc.contributor.authorSimoen, Eddy
dc.contributor.authorEneman, Geert
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorEneman, Geert
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.date.accessioned2021-10-18T19:46:30Z
dc.date.available2021-10-18T19:46:30Z
dc.date.issued2010
dc.identifier.issn0040-6090
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17724
dc.source.beginpage2517
dc.source.endpage2520
dc.source.issue9
dc.source.journalThin Solid Films
dc.source.volume518
dc.title

Effects of electron irradiation on SiGe devices

dc.typeJournal article
dspace.entity.typePublication
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