Publication:
Characteristics and correlated fluctuations of the gate and substrate current after soft oxide breakdown
Date
| dc.contributor.author | Crupi, Felice | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | Nigam, Tanya | |
| dc.contributor.author | Maes, Herman | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-09-30T11:37:22Z | |
| dc.date.available | 2021-09-30T11:37:22Z | |
| dc.date.issued | 1998 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2467 | |
| dc.source.conference | Proceedings Solid State Devices and Materials Conference; September 1998; Hiroshima, Japan. | |
| dc.source.conferencelocation | ||
| dc.title | Characteristics and correlated fluctuations of the gate and substrate current after soft oxide breakdown | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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