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Test strategies for wide-I/O memory, 3D-TSV technology test vehicles and ultra-fine-pitch applications
Publication:
Test strategies for wide-I/O memory, 3D-TSV technology test vehicles and ultra-fine-pitch applications
Date
2012-11
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Smith, Ken
;
Bock, Daniel
;
Gleeson, Read
;
Jolley, Mike
;
Marinissen, Erik Jan
Journal
Abstract
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1854
since deposited on 2021-10-20
Acq. date: 2025-10-28
Citations
Metrics
Views
1854
since deposited on 2021-10-20
Acq. date: 2025-10-28
Citations