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Protective films formed during the etching of TiSi2 and CoSi2 in F-based plasmas
Publication:
Protective films formed during the etching of TiSi2 and CoSi2 in F-based plasmas
Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baklanov, Mikhaïl
;
Vanhaelemeersch, Serge
;
Storm, Wolfgang
;
Vandervorst, Wilfried
;
Maex, Karen
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Abstract
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1957
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-08
Citations
Metrics
Views
1957
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-08
Citations