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Conference contributions
Electrical modeling of STT-MRAM defects
Publication:
Electrical modeling of STT-MRAM defects
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Date
2018-11
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Lizhou
;
Taouil, Mottaqiallah
;
Rao, Siddharth
;
Marinissen, Erik Jan
;
Hamdioui, Said
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1904
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Acq. date: 2025-12-12
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Views
1904
since deposited on 2021-10-26
3
last month
Acq. date: 2025-12-12
Citations