Publication:
Determination of layer morphology of rough layers in organic light emitting diodes by X-ray reflectivity
| dc.contributor.author | Sachs, Ian | |
| dc.contributor.author | Fuhrmann, Marc | |
| dc.contributor.author | Deferme, Wim | |
| dc.contributor.author | Moebius, Hildegard | |
| dc.contributor.imecauthor | Deferme, Wim | |
| dc.contributor.orcidimec | Deferme, Wim::0000-0002-8982-959X | |
| dc.date.accessioned | 2023-04-28T09:18:24Z | |
| dc.date.available | 2022-12-17T03:12:13Z | |
| dc.date.available | 2023-04-28T09:18:24Z | |
| dc.date.embargo | 2023-04-01 | |
| dc.date.issued | 2023 | |
| dc.identifier.doi | 10.1002/eng2.12594 | |
| dc.identifier.issn | 2577-8196 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40880 | |
| dc.publisher | WILEY | |
| dc.source.beginpage | Art. e12594 | |
| dc.source.endpage | na | |
| dc.source.issue | 4 | |
| dc.source.journal | ENGINEERING REPORTS | |
| dc.source.numberofpages | 13 | |
| dc.source.volume | 5 | |
| dc.subject.keywords | SURFACE-ROUGHNESS | |
| dc.title | Determination of layer morphology of rough layers in organic light emitting diodes by X-ray reflectivity | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |