Publication:

Fabrication and analysis of a Si/Si0.55Ge0.45 hetero-junction line tunnel FET

Date

2014
Journal article
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dc.contributor.authorWalke, Amey
dc.contributor.authorVandooren, Anne
dc.contributor.authorRooyackers, Rita
dc.contributor.authorLeonelli, Daniele
dc.contributor.authorHikavyy, Andriy
dc.contributor.authorLoo, Roger
dc.contributor.authorVerhulst, Anne
dc.contributor.authorKao, Frank
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorRao, V. Ramgopal
dc.contributor.authorBhuwalka, Krishna Kumar
dc.contributor.authorHeyns, Marc
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.contributor.imecauthorWalke, Amey
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorLeonelli, Daniele
dc.contributor.imecauthorHikavyy, Andriy
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorKao, Frank
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecHikavyy, Andriy::0000-0002-8201-075X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-22T08:09:05Z
dc.date.available2021-10-22T08:09:05Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24802
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6727530&queryText%3DFabrication+and+Analysis+of+a+Si%2FSi0.55Ge0.
dc.source.beginpage707
dc.source.endpage715
dc.source.issue3
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume61
dc.title

Fabrication and analysis of a Si/Si0.55Ge0.45 hetero-junction line tunnel FET

dc.typeJournal article
dspace.entity.typePublication
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