Trap density in conducting organic semiconductors determined from temperature dependence of J-V characteristics

dc.contributor.author	Kumar, Vikram
dc.contributor.author	Jain, Suresh
dc.contributor.author	Kapoor, A.K.
dc.contributor.author	Poortmans, Jef
dc.contributor.author	Mertens, Robert
dc.contributor.imecauthor	Poortmans, Jef
dc.contributor.imecauthor	Mertens, Robert
dc.contributor.orcidimec	Poortmans, Jef::0000-0003-2077-2545
dc.date.accessioned	2021-10-15T05:15:18Z
dc.date.available	2021-10-15T05:15:18Z
dc.date.issued	2003
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/7761
dc.source.beginpage	1283
dc.source.endpage	1285
dc.source.issue	2
dc.source.journal	Journal of Applied Physics
dc.source.volume	94
dc.title	Trap density in conducting organic semiconductors determined from temperature dependence of J-V characteristics
dc.type	Journal article
dspace.entity.type	Publication
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