Publication:

Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices

Date

2022
Journal article
https://doi.org/10.1109/TED.2022.3184622
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dc.contributor.authorModolo, N.
dc.contributor.authorDe Santi, C.
dc.contributor.authorBaratella, Giulio
dc.contributor.authorBettini, A.
dc.contributor.authorBorga, Matteo
dc.contributor.authorPosthuma, Niels
dc.contributor.authorBakeroot, Benoit
dc.contributor.authorYou, Shuzhen
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorBevilaqua, A.
dc.contributor.authorNeviani, A.
dc.contributor.authorMeneghesso, G.
dc.contributor.authorZanoni, E.
dc.contributor.authorMeneghini, M.
dc.contributor.imecauthorBaratella, Giulio
dc.contributor.imecauthorBorga, Matteo
dc.contributor.imecauthorPosthuma, Niels
dc.contributor.imecauthorBakeroot, Benoit
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecBaratella, Giulio::0000-0002-8193-3317
dc.contributor.orcidimecBorga, Matteo::0000-0003-3087-6612
dc.contributor.orcidimecPosthuma, Niels::0000-0002-6029-1909
dc.contributor.orcidimecBakeroot, Benoit::0000-0003-4392-1777
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2022-11-09T10:46:14Z
dc.date.available2022-07-21T02:27:21Z
dc.date.available2022-11-09T10:46:14Z
dc.date.embargo2022-08-01
dc.date.issued2022
dc.description.wosFundingTextThis work was supported in part by the iRel40 Project. iRel40 is a European Co-Funded Innovation Project that has been granted by the Electronics Components and Systems for European Leadership (ECSEL) Joint Undertaking (JU) under Grant 876659. The review of this article was arranged by Editor S. Chowdhury.
dc.identifier.doi10.1109/TED.2022.3184622
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40148
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage4432
dc.source.endpage4437
dc.source.issue8
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages6
dc.source.volume69
dc.subject.keywordsHEMTS
dc.title

Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices

dc.typeJournal article
dspace.entity.typePublication
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