Publication:
Unveiling the Vulnerability of Oxide-Breakdown-Based PUF
| dc.contributor.author | Saraza Canflanca, Pablo | |
| dc.contributor.author | Fodor, Ferenc | |
| dc.contributor.author | Diaz Fortuny, Javier | |
| dc.contributor.author | Gierlichs, B. | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Verbauwhede, I. | |
| dc.contributor.author | Bury, Erik | |
| dc.contributor.imecauthor | Saraza Canflanca, Pablo | |
| dc.contributor.imecauthor | Fodor, Ferenc | |
| dc.contributor.imecauthor | Diaz Fortuny, Javier | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Bury, Erik | |
| dc.contributor.orcidimec | Saraza Canflanca, Pablo::0000-0003-2155-8305 | |
| dc.contributor.orcidimec | Diaz Fortuny, Javier::0000-0002-8186-071X | |
| dc.contributor.orcidimec | Degraeve, Robin::0000-0002-4609-5573 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
| dc.date.accessioned | 2024-09-12T08:22:11Z | |
| dc.date.available | 2024-06-08T17:56:00Z | |
| dc.date.available | 2024-09-12T08:22:11Z | |
| dc.date.issued | 2024 | |
| dc.description.wosFundingText | This work was supported in part by the Cyber Security Research Flanders under Grant VR20192203. | |
| dc.identifier.doi | 10.1109/LED.2024.3369860 | |
| dc.identifier.issn | 0741-3106 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44007 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 750 | |
| dc.source.endpage | 753 | |
| dc.source.issue | 5 | |
| dc.source.journal | IEEE ELECTRON DEVICE LETTERS | |
| dc.source.numberofpages | 4 | |
| dc.source.volume | 45 | |
| dc.title | Unveiling the Vulnerability of Oxide-Breakdown-Based PUF | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |