Publication:
Effective hole mobility and low-frequency noise characterization of strained Ge pFinFETs
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1936 since deposited on 2021-10-23
1last month
1last week
Acq. date: 2026-07-17
Citations
Statistics
Views
1936 since deposited on 2021-10-23
1last month
1last week
Acq. date: 2026-07-17
Citations