Publication:
ESD challenges in advanced FinFET and GAA nanowire CMOS technologies
Date
| dc.contributor.author | Chen, Shih-Hung | |
| dc.contributor.imecauthor | Chen, Shih-Hung | |
| dc.date.accessioned | 2021-10-27T07:59:24Z | |
| dc.date.available | 2021-10-27T07:59:24Z | |
| dc.date.issued | 2019 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32693 | |
| dc.identifier.url | https://ieeexplore.ieee.org/document/8780136 | |
| dc.source.conference | 2019 IEEE Custom Integrated Circuits Conference (CICC) | |
| dc.source.conferencedate | 14/04/2019 | |
| dc.source.conferencelocation | Austin, TX USA | |
| dc.title | ESD challenges in advanced FinFET and GAA nanowire CMOS technologies | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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