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On the geometry dependence of the 1/f noise in CMOS compatible junction diodes
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On the geometry dependence of the 1/f noise in CMOS compatible junction diodes
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Date
1999
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
Journal
IEEE Trans. Electron Devices
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1889
since deposited on 2021-10-14
Acq. date: 2025-12-16
Citations
Metrics
Views
1889
since deposited on 2021-10-14
Acq. date: 2025-12-16
Citations