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Diode analysis of deep submicron CMOS p-well implantation damage
Publication:
Diode analysis of deep submicron CMOS p-well implantation damage
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Date
2002
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Poyai, Amporn
;
Simoen, Eddy
;
Claeys, Cor
;
Rooyackers, Rita
Journal
Abstract
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1955
since deposited on 2021-10-14
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last month
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last week
Acq. date: 2025-12-15
Citations
Metrics
Views
1955
since deposited on 2021-10-14
1
last month
1
last week
Acq. date: 2025-12-15
Citations