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High resolution scanning spreading resistance microscopy of fully depleted silicon-on-insulator devices and double-gate transistors
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1993 since deposited on 2021-10-15
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Acq. date: 2025-10-25
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Metrics
Views
1993 since deposited on 2021-10-15
421item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations