Publication:
High resolution scanning spreading resistance microscopy of fully depleted silicon-on-insulator devices and double-gate transistors
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1996 since deposited on 2021-10-15
1last month
Acq. date: 2025-12-16
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Metrics
Views
1996 since deposited on 2021-10-15
1last month
Acq. date: 2025-12-16
Citations