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Silicon photonic phase interrogators for on-chip calibration of optical phased arrays

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dc.contributor.authorKjellman, Jon
dc.contributor.authorProst, Mathias
dc.contributor.authorMarinins, Aleksandrs
dc.contributor.authorTyagi, Hemant Kumar
dc.contributor.authorKongnyuy, Tangla David
dc.contributor.authorKerman, Sarp
dc.contributor.authorTroia, Benedetto
dc.contributor.authorFigeys, Bruno
dc.contributor.authorDwivedi, Sarvagya Paavan
dc.contributor.authorDahlem, Marcus
dc.contributor.authorSoussan, Philippe
dc.contributor.authorRottenberg, Xavier
dc.contributor.authorJansen, Roelof
dc.contributor.imecauthorKjellman, Jon
dc.contributor.imecauthorProst, Mathias
dc.contributor.imecauthorMarinins, Aleksandrs
dc.contributor.imecauthorTyagi, Hemant Kumar
dc.contributor.imecauthorKongnyuy, Tangla David
dc.contributor.imecauthorFigeys, Bruno
dc.contributor.imecauthorDwivedi, Sarvagya Paavan
dc.contributor.imecauthorDahlem, Marcus
dc.contributor.imecauthorSoussan, Philippe
dc.contributor.imecauthorRottenberg, Xavier
dc.contributor.imecauthorJansen, Roelof
dc.contributor.orcidimecFigeys, Bruno::0000-0002-0108-3907
dc.contributor.orcidimecDwivedi, Sarvagya Paavan::0000-0003-1184-3225
dc.contributor.orcidimecDahlem, Marcus::0000-0002-1373-6709
dc.contributor.orcidimecSoussan, Philippe::0000-0002-1347-6978
dc.contributor.orcidimecJansen, Roelof::0000-0001-6685-4699
dc.date.accessioned2021-10-28T23:22:16Z
dc.date.available2021-10-28T23:22:16Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35394
dc.identifier.urlhttps://doi.org/10.1117/12.2546542
dc.source.beginpage112830
dc.source.conferenceIntegrated Optics: Devices, Materials, and Technologies XXIV
dc.source.conferencedate1/02/2020
dc.source.conferencelocationSan Francisco USA
dc.title

Silicon photonic phase interrogators for on-chip calibration of optical phased arrays

dc.typeProceedings paper
dspace.entity.typePublication
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