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Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
Publication:
Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
Date
2017-09
Proceedings Paper
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37195.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lambrecht, Niels
;
De Zutter, Daniel
;
Vande Ginste, Dries
;
Pues, Hugo
Journal
Abstract
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1909
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations
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Views
1909
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations