Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Presentations
Study of the transient phenomena in SIMS depth profiling using combined SIMS-RBS
Publication:
Study of the transient phenomena in SIMS depth profiling using combined SIMS-RBS
Copy permalink
Date
1997
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Deleu, Jeroen
;
Brijs, Bert
;
Vandervorst, Wilfried
Journal
Abstract
Description
Metrics
Views
1943
since deposited on 2021-09-30
Acq. date: 2025-12-15
Citations
Metrics
Views
1943
since deposited on 2021-09-30
Acq. date: 2025-12-15
Citations