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A design experiment for measurement of the spectral content of substrate noise in mixed-signal integrated circuits
Publication:
A design experiment for measurement of the spectral content of substrate noise in mixed-signal integrated circuits
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Date
1999
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Heijningen, Marc
;
Compiet, John
;
Wambacq, P.
;
Donnay, Stephane
;
Bolsens, Ivo
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Abstract
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1989
since deposited on 2021-10-14
Acq. date: 2025-12-10
Citations
Metrics
Views
1989
since deposited on 2021-10-14
Acq. date: 2025-12-10
Citations