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Conference contributions
Imaging semiconductor patterns at N10 logic node with a high-throughput multi-beam SEM
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Imaging semiconductor patterns at N10 logic node with a high-throughput multi-beam SEM
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Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Neumann, J.T.
;
Garaboski, T.
;
Halder, Sandip
;
Leray, Philippe
;
Garreis, R.
;
Zeidler, D.
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Acq. date: 2025-12-11
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Views
1844
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-11
Citations