Publication:

Endurance improvement of more than five orders in GexSe1-x OTS selectors by using a novel refreshing scheme

Date

2019
Proceedings Paper
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dc.contributor.authorHatem, Firas Odai Hatem
dc.contributor.authorChai, Z.
dc.contributor.authorZhang, Wei
dc.contributor.authorFantini, Andrea
dc.contributor.authorDegraeve, Robin
dc.contributor.authorClima, Sergiu
dc.contributor.authorGarbin, Daniele
dc.contributor.authorRobertson, J.
dc.contributor.authorGuo, Y,
dc.contributor.authorZhang, J.F.
dc.contributor.authorMarsland, John
dc.contributor.authorFreitas, Pedro
dc.contributor.authorGoux, Ludovic
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorGarbin, Daniele
dc.contributor.imecauthorFreitas, Pedro
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecGarbin, Daniele::0000-0002-5884-1043
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.accessioned2021-10-27T10:07:38Z
dc.date.available2021-10-27T10:07:38Z
dc.date.embargo9999-12-31
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33107
dc.source.beginpage827
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM 2019
dc.source.conferencedate7/12/2019
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage830
dc.title

Endurance improvement of more than five orders in GexSe1-x OTS selectors by using a novel refreshing scheme

dc.typeProceedings paper
dspace.entity.typePublication
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