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The dawn of surface analysis that stands by the side of users - Ultra-thin film analysis by rf-GDOES
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The dawn of surface analysis that stands by the side of users - Ultra-thin film analysis by rf-GDOES
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Shimizu, K.
;
Habazaki, H.
;
Gijbels, R.
;
Bender, Hugo
Journal
Engineering Materials
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1860
since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations
Metrics
Views
1860
since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations