Impact of proton irradiation on strained triple gate SOI p- and n-MOSFETs

dc.contributor.author	Agopian, P.G.D.
dc.contributor.author	Martino, J.A.
dc.contributor.author	Koboyashi, D.
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-19T12:28:34Z
dc.date.available	2021-10-19T12:28:34Z
dc.date.issued	2011
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/18458
dc.source.beginpage	7
dc.source.conference	European Conference on Radiation Effects on Component and Systems - RADECS
dc.source.conferencedate	19/09/2011
dc.source.conferencelocation	Sevilla Spain
dc.source.endpage	10
dc.title	Impact of proton irradiation on strained triple gate SOI p- and n-MOSFETs
dc.type	Proceedings paper
dspace.entity.type	Publication
Files
Publication available in collections:	Conference contributions

Date