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Articles
Positive bias temperature instabilities on sub-nanometer EOT FinFETs
Publication:
Positive bias temperature instabilities on sub-nanometer EOT FinFETs
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Feijoo, Pedro C.
;
Cho, Moon Ju
;
Togo, Mitsuhiro
;
San Andrés, Enrique
;
Groeseneken, Guido
Journal
Microelectronics Reliability
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1887
since deposited on 2021-10-19
Acq. date: 2025-12-13
Citations
Metrics
Views
1887
since deposited on 2021-10-19
Acq. date: 2025-12-13
Citations