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Metrology and physical mechanisms in new generation ionic devices

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dc.contributor.authorCelano, Umberto
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.date.accessioned2021-10-23T10:13:42Z
dc.date.available2021-10-23T10:13:42Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26411
dc.identifier.urlhttp://www.springer.com/us/book/9783319395302
dc.title

Metrology and physical mechanisms in new generation ionic devices

dc.typeBook
dspace.entity.typePublication
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