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Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements

Date

2025-JAN 31
Journal article
https://doi.org/10.1088/2515-7647/ada902
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dc.contributor.authorDe Geest, Kobe
dc.contributor.authorLievens, Enes
dc.contributor.authorPicavet, Ewout
dc.contributor.authorDe Buysser, Klaartje
dc.contributor.authorVan Thourhout, Dries
dc.contributor.authorBeeckman, Jeroen
dc.contributor.imecauthorVan Thourhout, Dries
dc.contributor.orcidimecVan Thourhout, Dries::0000-0003-0111-431X
dc.date.accessioned2025-02-02T17:53:58Z
dc.date.available2025-02-02T17:53:58Z
dc.date.issued2025-JAN 31
dc.description.wosFundingTextThis work was financially supported by Horizon Europe Project VISSION (Grant ID: 101070622).
dc.identifier.doi10.1088/2515-7647/ada902
dc.identifier.issn2515-7647
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45140
dc.publisherIOP Publishing Ltd
dc.source.issue1
dc.source.journalJOURNAL OF PHYSICS-PHOTONICS
dc.source.numberofpages13
dc.source.volume7
dc.subject.keywordsMACH-ZEHNDER MODULATORS
dc.subject.keywordsELECTROOPTICAL PROPERTIES
dc.subject.keywordsSILICON
dc.subject.keywordsPZT
dc.title

Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements

dc.typeJournal article
dspace.entity.typePublication
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