Publication:
Radiation damages of polycrystalline silicon films and NPN Si transistors by high-energy particle irradiation
Date
| dc.contributor.author | Ohyama, Hidenori | |
| dc.contributor.author | Nakabayashi, M. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, C. | |
| dc.contributor.author | Tanaka, T. | |
| dc.contributor.author | Hirao, T. | |
| dc.contributor.author | Onada, S. | |
| dc.contributor.author | Kobayashi, K. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-14T17:29:12Z | |
| dc.date.available | 2021-10-14T17:29:12Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5533 | |
| dc.source.conference | Proceedings of the 12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF; | |
| dc.source.conferencelocation | ||
| dc.title | Radiation damages of polycrystalline silicon films and NPN Si transistors by high-energy particle irradiation | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |