Publication:

On the CET-Map Ill-Posed Inversion Problem: Theory and Application to GaN HEMTs

Date

2024
Journal article
https://doi.org/10.1109/TED.2023.3284806
Simple item page Full metadata Statistics
 
dc.contributor.authorModolo, Nicola
dc.contributor.authorDe Santi, Carlo
dc.contributor.authorBaratella, Giulio
dc.contributor.authorMinetto, Andrea
dc.contributor.authorSayadi, Luca
dc.contributor.authorSicre, Sebastien
dc.contributor.authorPrechtl, Gerhard
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorZanoni, Enrico
dc.contributor.authorMeneghini, Matteo
dc.contributor.imecauthorBaratella, Giulio
dc.contributor.orcidimecBaratella, Giulio::0000-0002-8193-3317
dc.date.accessioned2024-03-19T10:00:23Z
dc.date.available2023-07-26T17:11:31Z
dc.date.available2024-03-19T10:00:23Z
dc.date.embargo2023-06-30
dc.date.issued2024
dc.identifier.doi10.1109/TED.2023.3284806
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42196
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage1646
dc.source.endpage1653
dc.source.issue3
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages8
dc.source.volume71
dc.subject.keywordsTHRESHOLD VOLTAGE INSTABILITY
dc.subject.keywordsDRAIN CURRENT DLTS
dc.subject.keywordsALGAN/GAN HEMTS
dc.subject.keywordsSPECTROSCOPY
dc.subject.keywordsTRAPS
dc.title

On the CET-Map Ill-Posed Inversion Problem: Theory and Application to GaN HEMTs

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
On_the_CET-Map_Ill-Posed_Inversion_Problem_Theory_and_Application_to_GaN_HEMTs.pdf
Size:
5.14 MB
Format:
Adobe Portable Document Format
Description:
Published version
Download
Publication available in collections:
Articles