Publication:

A bio-impedance readout IC with digital-assisted baseline cancellation for 2-electrode measurement

Date

2019
Proceedings Paper
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dc.contributor.authorHa, Hyunsoo
dc.contributor.authorSijbers, Wim
dc.contributor.authorVan Wegberg, Roland
dc.contributor.authorXu, Jiawei
dc.contributor.authorKonijnenburg, Mario
dc.contributor.authorVis, Peter
dc.contributor.authorBreeschoten, Arjan
dc.contributor.authorSong, Shuang
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorVan Helleputte, Nick
dc.contributor.imecauthorSijbers, Wim
dc.contributor.imecauthorVan Wegberg, Roland
dc.contributor.imecauthorKonijnenburg, Mario
dc.contributor.imecauthorVis, Peter
dc.contributor.imecauthorBreeschoten, Arjan
dc.contributor.imecauthorSong, Shuang
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.imecauthorVan Helleputte, Nick
dc.contributor.orcidimecSijbers, Wim::0000-0003-2015-785X
dc.contributor.orcidimecKonijnenburg, Mario::0000-0001-8016-0888
dc.contributor.orcidimecVan Hoof, Chris::1234-1234-1234-1234
dc.contributor.orcidimecVan Helleputte, Nick::0000-0002-7511-1923
dc.date.accessioned2021-10-27T09:53:40Z
dc.date.available2021-10-27T09:53:40Z
dc.date.embargo9999-12-31
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33071
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8662433
dc.source.beginpage368
dc.source.conference2019 IEEE International Solid-State Circuits Conference - ISSCC
dc.source.conferencedate17/02/2019
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage369
dc.title

A bio-impedance readout IC with digital-assisted baseline cancellation for 2-electrode measurement

dc.typeProceedings paper
dspace.entity.typePublication
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