Publication:
Passivation and interface state density of SiO2/HfO2-based/polycrystalline-Si gate stacks
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1865 since deposited on 2021-10-15
2last month
Acq. date: 2025-12-15
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Metrics
Views
1865 since deposited on 2021-10-15
2last month
Acq. date: 2025-12-15
Citations