Publication:

On the impact of metal impurities on the carrier lifetime in n-type germanium

Date

 
dc.contributor.authorGaubas, E.
dc.contributor.authorVanhellemont, J.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorTheuwis, A.
dc.contributor.authorClauws, P.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-16T16:13:48Z
dc.date.available2021-10-16T16:13:48Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12184
dc.source.beginpage0994-F09-06
dc.source.conferenceSemiconductor Defect Engineering - Materials, Synthesis, Structures and Devices II
dc.source.conferencedate9/04/2007
dc.source.conferencelocationSan Francisco, CA USA
dc.title

On the impact of metal impurities on the carrier lifetime in n-type germanium

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections: