Publication:

A Robust Bayesian Optimization Framework for Microwave Circuit Design under Uncertainty

Date

2022
Journal article
https://doi.org/10.3390/electronics11142267
Simple item page Full metadata Statistics
 
dc.contributor.authorDe Witte, Duygu
dc.contributor.authorQing, Jixiang
dc.contributor.authorCouckuyt, Ivo
dc.contributor.authorDhaene, Tom
dc.contributor.authorVande Ginste, Dries
dc.contributor.authorSpina, Domenico
dc.contributor.imecauthorDe Witte, Duygu
dc.contributor.imecauthorQing, Jixiang
dc.contributor.imecauthorCouckuyt, Ivo
dc.contributor.imecauthorDhaene, Tom
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.imecauthorSpina, Domenico
dc.contributor.orcidimecQing, Jixiang::0000-0002-6446-6286
dc.contributor.orcidimecCouckuyt, Ivo::0000-0002-9524-4205
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.contributor.orcidimecSpina, Domenico::0000-0003-2379-5259
dc.date.accessioned2022-09-07T10:12:35Z
dc.date.available2022-08-08T02:36:09Z
dc.date.available2022-09-02T10:33:53Z
dc.date.available2022-09-07T10:12:35Z
dc.date.issued2022
dc.description.wosFundingTextThis work has been supported by the Flemish Government under the `Onderzoeksprogramma Artificiele Intelligentie (AI) Vlaanderen' programme.
dc.identifier.doi10.3390/electronics11142267
dc.identifier.issn2079-9292
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40233
dc.publisherMDPI
dc.source.beginpage2267
dc.source.endpagena
dc.source.issue14
dc.source.journalELECTRONICS
dc.source.numberofpages14
dc.source.volume11
dc.subject.keywordsFILTER
dc.title

A Robust Bayesian Optimization Framework for Microwave Circuit Design under Uncertainty

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
8130.pdf
Size:
4.47 MB
Format:
Unknown data format
Description:
Published version
Download
Publication available in collections:
Articles