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Evaluation of the electrical contact area in contact-mode scanning probe microscopy
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Evaluation of the electrical contact area in contact-mode scanning probe microscopy
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Celano, Umberto
;
Hantschel, Thomas
;
Giammaria, Guido
;
Chintala, Ravi Chandra
;
Conard, Thierry
;
Bender, Hugo
;
Vandervorst, Wilfried
Journal
Journal of Applied Physics
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1901
since deposited on 2021-10-22
Acq. date: 2025-12-11
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1
since deposited on 2021-10-22
Acq. date: 2025-12-11
Views
1901
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations