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Towards an understanding of ion beam mixing by quantitative internal profiling
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Towards an understanding of ion beam mixing by quantitative internal profiling
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Date
1998
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tian, Chunsheng
;
Gomez, Jose Ignacio
;
Beyer, Gerald
;
De Bisschop, Peter
;
Vandervorst, Wilfried
;
Wu, Ting-Di
;
D'Olieslaeger, Marc
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2046
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Acq. date: 2025-12-10
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2046
since deposited on 2021-10-01
2
last month
Acq. date: 2025-12-10
Citations