Publication:

Physics-informed machine learning to analyze oxide defect-induced RTN in gate leakage current

Date

2024

Proceedings Paper

https://doi.org/10.1109/IRPS48228.2024.10529341

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Author(s)

Varanasi, Anirudh

;

Degraeve, Robin

;

Roussel, Philippe

;

;

Merckling, Clement

Journal

N/A

Statistics

618 since deposited on 2024-08-16

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Acq. date: 2026-02-25