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Methodology and experimental verification for substrate noise reduction in CMOS mixed-signal ICs with synchronous circuits

Date

2002
Journal article
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dc.contributor.authorBadaroglu, Mustafa
dc.contributor.authorVan Heijningen, Marc
dc.contributor.authorGravot, Vincent
dc.contributor.authorCompiet, John
dc.contributor.authorDonnay, Stephane
dc.contributor.authorGielen, Georges
dc.contributor.authorDe Man, Hugo
dc.contributor.imecauthorBadaroglu, Mustafa
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.imecauthorGielen, Georges
dc.contributor.imecauthorDe Man, Hugo
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.date.accessioned2021-10-14T21:07:42Z
dc.date.available2021-10-14T21:07:42Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5978
dc.source.beginpage1383
dc.source.endpage1395
dc.source.issue11
dc.source.journalIEEE J. Solid-State Circuits
dc.source.volume37
dc.title

Methodology and experimental verification for substrate noise reduction in CMOS mixed-signal ICs with synchronous circuits

dc.typeJournal article
dspace.entity.typePublication
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